Atomic Force Microscope (AFM) | FAKULTI SAINS
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Atomic Force Microscope (AFM)





Brand name: Bruker Crest 
Model name: Dimension Edge With Scanasyst
Location:Advanced Atomic Force Microscopy Laboratory (Block D, Room 049 & 050) Department of Physics, Faculty of Science, UPM.
Contact Person: Miss Nurul Shahida Ramli, Miss Zulaikha Haziqah Mohd Zulkifli


Description:
The Atomic force microscope allows us to investigate the structure and morphology of the surface. This is a powerful technique which generates topographic images of the structure with atomic resolution.
AFM used as an surface imaging tool:
-scan the surface materials to produce topographical images
-used to determine roughness, grain size, and features on the nanoscale
-can resolve individual holes, defects and atomic clusters
AFM has been used for measurements on a wide variety of sample types such as thin and thick film coatings, ceramics, composites, glasses, synthetic and biological membrane, metals, polymers and semiconductors.
Scan available: 0-40 microns , 0-100 microns
Sample size: minimum 1 cm X 1 cm

FORM Atomic Force Microscope (AFM)

 

Kemaskini:: 12/04/2023 [kashfi.shabdin]

PERKONGSIAN MEDIA

FAKULTI SAINS
Universiti Putra Malaysia
43400 UPM Serdang
Selangor Darul Ehsan
0397696601/6602/6603
0397693237
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