Brand name:AMBIOS
Model name:XP-200
Location:Department of Physics- 2^nd Floor
Contact Person:Mrs. Noor Farizatul Shida Abd. Rahman

Description:
A stylus scans the sample surface at programmable speed, while its positions sampled at small and regular intervals. The data is logged and then processed by the application software to extract useful information such as step height, surface roughness and waviness.
Summary of the system features:
High ranges - 2.5.10 , 100µm
Minimum resolution step - 1 nm (10Å)
Step Height Repeatability - 0.5nm or 0.1% range
Scan Length Maximum - 55mm
Scan Speed Ranges - 0.01 to 2.00mm /sec
Sample Stage - 200mm diameter with optional vacuum
Stage Translation - 150x178 mm
Stage Rotation - Manual, operation, 180⁰ in X-Y plane and tilt for slope correction
Stylus Tip - Radius 2.5 µm, apex angle 60⁰ bevel height 200 µm


FORM High Surface Stylus Profilemeter

Updated:: 28/05/2015 [n_linda]