Brand name: Brunker Crest

Model name: Dimension Edge with Scanasyst

Description:

The Atomic force microscope allows us to investigate the structure and morphology of the surface. This is a powerful technique which generates topographic images of the structure with atomic resolution.

AFM used as an surface imaging tool:

• Scan the surface materials to produce topographical images
• Used to determine roughness, grain size, and features on the nanoscale
• Can resolve individual holes, defects and atomic clusters
  
  

AFM has been used for measurements on a wide variety of sample types such as thin and thick film coatings, ceramics, composites, glasses, synthetic and biological membrane, metals, polymers and semiconductors.

Scan available: 0-40 microns , 0-100 microns

Sample size: minimum 1 cm X 1 cm

Scan Mode :

• Scanasyst/Tapping/Contact
• Conductive AFM (1 DC bias)
• Magnetic Force Microscopy
• Piezoresponse Force Microscopy
• Force Spectroscopy
  
  

Location: Room 049 & 050, Block D, Faculty of Science 2, Universiti Putra Malaysia

Contact person:

		Nurul Shahida Ramli (Miss) Assistant Science Officer  Tel: +603 97693233 Email: nurulshahida@upm.edu.my
		Zulaikha Haziqah Mohd Zulkifli (Miss) Assistant Science Officer  Tel: +603 97696656 Email: zulaikhahaziqah@upm.edu.my

Atomic Force Microscope (AFM) Form

BR045 Form

Updated:: 20/11/2024 [harithdaniel]